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Brilliance +

Next-generation electron beam position processor

Additional photos

Brilliance +

Performance



@~300 kHz revolution frequency
 Turn-by-turn resolution  0.35 µm
 Fast data resolution (10 kHz rate) 0.07 µm
 Beam current dependence 0.5 µm
 Crosstalk between channels better than -50 dB

 

 

Beam Current Dependence Comparison

 

Typical position variation: around 1 μm down to -80 dBm input signal level at centered beam and down to -60 dBm input signal level at off-centered beam position (~600 μm).

comparison 5

 

 

Machine Physics Studies

 

The raw wideband Analog to Digital Converter (ADC) data buffer allows detailed analysis of fast phenomena that last up to several milliseconds. The newly introduced turn-by-turn calculation method, called Time Domain Processing (TDP), is intended for short fill or single bunch fill patterns. The RMS on the turn-by-turn data is improved by factor of 4-5 compared to classic Digital Down Converter (DDC) calculation method.

test4 tbt



 



Supplementary products

Signal generator for optimal testing and SW development.
RF&Clock Generator
Electronic switch intended for electronic switching of various signals.
RF Gate
Implemented into Libera Brilliance+ enables fast global orbit feedback.
GDX Module

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